PhotoBatteryInc.

PhotoBattery Project · CHAR

Materials Characterization & Metrology

Advanced structural, chemical, optical, electrical and nanoscale characterization for process development and root-cause analysis.

Project overview

A focused route from technical question to measurable work

Materials Characterization & Metrology brings together advanced structural, chemical, optical, electrical and nanoscale characterization for process development and root-cause analysis.

PhotoBattery organizes this project as a gateway to 20 specialized technical services, with each engagement scoped around measurable inputs, methods, deliverables and acceptance criteria.

Specialized services

Services within this project

All 24 projects
Spectroscopic Ellipsometry Thin-Film Thickness & Optical Constant Mapping

CHAR-001

Spectroscopic Ellipsometry Thin-Film Thickness & Optical Constant Mapping

Materials Characterization & Metrology

Atomic Force Microscopy Surface Roughness & Nanostructure Analysis

CHAR-002

Atomic Force Microscopy Surface Roughness & Nanostructure Analysis

Materials Characterization & Metrology

High-Resolution XRD Thin-Film Crystallinity & Strain Characterization

CHAR-003

High-Resolution XRD Thin-Film Crystallinity & Strain Characterization

Materials Characterization & Metrology

XPS Surface Chemistry & Interface Contamination Analysis

CHAR-004

XPS Surface Chemistry & Interface Contamination Analysis

Materials Characterization & Metrology

FIB-SEM Cross-Sectional Failure Analysis

CHAR-005

FIB-SEM Cross-Sectional Failure Analysis

Materials Characterization & Metrology

TEM & STEM Interface and Atomic-Scale Defect Analysis

CHAR-006

TEM & STEM Interface and Atomic-Scale Defect Analysis

Materials Characterization & Metrology

SEM Surface Morphology & Critical-Dimension Inspection

CHAR-007

SEM Surface Morphology & Critical-Dimension Inspection

Materials Characterization & Metrology

EDX Elemental Composition & Contamination Mapping

CHAR-008

EDX Elemental Composition & Contamination Mapping

Materials Characterization & Metrology

Raman Spectroscopy & Wafer-Scale Material Mapping

CHAR-009

Raman Spectroscopy & Wafer-Scale Material Mapping

Materials Characterization & Metrology

SIMS Depth Profiling & Interface Composition Analysis

CHAR-010

SIMS Depth Profiling & Interface Composition Analysis

Materials Characterization & Metrology

Optical Profilometry & Thin-Film Step-Height Measurement

CHAR-011

Optical Profilometry & Thin-Film Step-Height Measurement

Materials Characterization & Metrology

Thin-Film Residual Stress & Wafer Bow Measurement

CHAR-012

Thin-Film Residual Stress & Wafer Bow Measurement

Materials Characterization & Metrology

Thin-Film Adhesion, Delamination & Interface Strength Testing

CHAR-013

Thin-Film Adhesion, Delamination & Interface Strength Testing

Materials Characterization & Metrology

Micro-CT Internal Defect & Package Inspection

CHAR-014

Micro-CT Internal Defect & Package Inspection

Materials Characterization & Metrology

GC-MS Battery Gas & Volatile Degradation Analysis

CHAR-015

GC-MS Battery Gas & Volatile Degradation Analysis

Materials Characterization & Metrology

Optical Loss & Cavity Ring-Down Characterization

CHAR-016

Optical Loss & Cavity Ring-Down Characterization

Materials Characterization & Metrology

Laser-Induced Damage Threshold Qualification

CHAR-017

Laser-Induced Damage Threshold Qualification

Materials Characterization & Metrology

Optical Spectral Transmission, Reflection & Absorption Characterization

CHAR-018

Optical Spectral Transmission, Reflection & Absorption Characterization

Materials Characterization & Metrology

Hall Effect Carrier Density & Mobility Characterization

CHAR-019

Hall Effect Carrier Density & Mobility Characterization

Materials Characterization & Metrology

Four-Point Probe Sheet Resistance & Conductive Film Mapping

CHAR-020

Four-Point Probe Sheet Resistance & Conductive Film Mapping

Materials Characterization & Metrology